Scherrer Equation:
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The Scherrer equation is used in X-ray diffraction (XRD) to estimate the size of crystallites in a solid material from the broadening of peaks in the diffraction pattern. It provides an average size of the ordered domains that diffract X-rays coherently.
The calculator uses the Scherrer equation:
Where:
Explanation: The equation relates the peak broadening in an XRD pattern to the size of crystallites in the sample, assuming the broadening is solely due to size effects.
Details: Crystallite size is a fundamental material property affecting mechanical strength, chemical reactivity, and other physical properties. Accurate size determination is crucial in materials science and nanotechnology.
Tips: Enter wavelength in nm, FWHM in radians, and angle in degrees. All values must be positive (angle between 0-90°). For best results, use data from high-quality XRD measurements.
Q1: What is the 0.94 factor in the equation?
A: This is the Scherrer constant (K) that depends on crystallite shape and size distribution. 0.94 is commonly used for spherical crystals with cubic symmetry.
Q2: What are the limitations of the Scherrer equation?
A: It assumes peak broadening is only due to crystallite size. Other factors like strain, instrument broadening, and defects can affect results.
Q3: How accurate is crystallite size from XRD?
A: Typically ±10-20% for well-prepared samples. For more accurate results, use multiple peaks and advanced analysis methods.
Q4: What's the difference between crystallite and particle size?
A: A particle may consist of multiple crystallites. XRD measures coherently diffracting domains (crystallites), not necessarily whole particles.
Q5: Can I use this for nanocrystalline materials?
A: Yes, the Scherrer equation is particularly useful for nanomaterials (typically <100 nm). For larger crystals, other broadening effects may dominate.