Scherrer Equation:
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The Scherrer equation is used in X-ray diffraction (XRD) to estimate the size of crystalline particles (granules) in a solid sample. It relates the angular width of diffraction peaks to particle size.
The calculator uses the Scherrer equation:
Where:
Explanation: The equation shows that smaller particles produce broader diffraction peaks, while larger particles produce sharper peaks.
Details: Granule size affects material properties like strength, reactivity, and optical characteristics. XRD analysis provides a non-destructive way to measure crystallite size.
Tips: Enter wavelength in nm, FWHM in radians, and angle in degrees. Typical X-ray wavelengths: Cu Kα = 0.15418 nm, Co Kα = 0.17902 nm.
Q1: What is the Scherrer constant (0.94)?
A: It's a shape factor that depends on particle shape and how size is defined. 0.94 is common for spherical particles with size defined as diameter.
Q2: What are the limitations of this equation?
A: It doesn't account for strain broadening and is only accurate for particles smaller than about 100-200 nm.
Q3: How to measure FWHM (β)?
A: From XRD data, measure the full width at half maximum of the diffraction peak after subtracting instrumental broadening.
Q4: Why convert angle to radians?
A: The trigonometric functions in programming languages typically use radians, so conversion is necessary for accurate calculation.
Q5: Can this be used for all crystal systems?
A: Yes, but results are most accurate for isotropic materials. Anisotropic materials may require more complex analysis.